ISTFA 2004

proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester"s Centrum Centre, Worcester (Boston), Massachusetts by International Symposium for Testing and Failure Analysis (30th 2004 Boston, Mass.)

Publisher: ASM International in Materials Park, Ohio

Written in English
Published: Pages: 697 Downloads: 248
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  • Electronics -- Materials -- Testing -- Congresses,
  • Electronic apparatus and appliances -- Testing -- Congresses

Edition Notes

Includes bibliographical references and index.

Statementsponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2004, ASM International.
ContributionsASM International., Electronic Device Failure Analysis Society.
LC ClassificationsTK7871 .I583 2004
The Physical Object
Paginationxx, 697 p. :
Number of Pages697
ID Numbers
Open LibraryOL3438997M
ISBN 100871708078
LC Control Number2005298158

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